Part Number Hot Search : 
XL28C16B 20007 TEA550 SRD1040 2SC2996 GLZ33D L78L05 05M000
Product Description
Full Text Search
 

To Download TPCF8302 Datasheet File

  If you can't view the Datasheet, Please click here to try to view without PDF Reader .  
 
 


  Datasheet File OCR Text:
 TPCF8302
TOSHIBA Field Effect Transistor Silicon P Channel MOS Type (U-MOS IV)
TPCF8302
Notebook PC Applications Portable Equipment Applications
* * * * Low drain-source ON resistance: RDS (ON) = 44 m (typ.) High forward transfer admittance: |Yfs| = 6.2 S (typ.) Low leakage current: IDSS = -10 A (max) (VDS = -20 V) Enhancement mode: Vth = -0.5 to -1.2 V (VDS = -10 V, ID = -200 A) Unit: mm
Absolute Maximum Ratings (Ta = 25C)
Characteristics Drain-source voltage Drain-gate voltage (RGS = 20 k) Gate-source voltage Drain current DC Pulse (Note 1) (Note 1) Symbol VDSS VDGR VGSS ID IDP PD (1) PD (2) PD (1) PD (2) EAS IAR EAR Tch Tstg Rating -20 -20 10 -3.0 -12 1.35 1.12 W 0.53 0.33 0.58 -1.5 0.11 150 -55~150 mJ A mJ C C Unit V V V A
JEDEC JEITA TOSHIBA
2-3U1B
Drain power dissipation (t = 5 s) (Note 2a) Single-device value at dual operation (Note 3b)
Single-device operation (Note 3a)
Weight: 0.011 g (typ.)
Circuit Configuration
8 7 6 5
Single-device operation Drain power (Note 3a) dissipation (t = 5 s) (Note 2b) Single-device value at dual operation (Note 3b) Single pulse avalanche energy Avalanche current Repetitive avalanche energy Single-device value at dual operation (Note 2a, 3b, 5) Channel temperature Storage temperature range (Note 4)
1
2
3
4
Note: (Note 1), (Note 2), (Note 3), (Note 4), (Note 5) and (Note 6): See the next page.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
This transistor is an electrostatic-sensitive device. Please handle with caution.
1
2006-11-16
TPCF8302
Thermal Characteristics
Characteristics Single-device operation Thermal resistance, (Note 3a) channel to ambient (t = 5 s) (Note 2a) Single-device value at dual operation (Note 3b) Single-device operation Thermal resistance, (Note 3a) channel to ambient (t = 5 s) (Note 2b) Single-device value at dual operation (Note 3b) Symbol Rth (ch-a) (1) Rth (ch-a) (2) Rth (ch-a) (1) Rth (ch-a) (2) Max 92.6 C/W 111.6 235.8 C/W 378.8 Unit
Marking (Note 6)
Lot code (month) Lot No.
Part No. (or abbreviation code)
F5B
Product-specific code Lot code (year) A line indicates lead (Pb)-free package or lead (Pb)-free finish.
Pin #1
Note 1: Ensure that the channel temperature does not exceed 150. Note 2: (a) Device mounted on a glass-epoxy board (a)
25.4
(b) Device mounted on a glass-epoxy board (b)
FR-4 25.4 x 25.4 x 0.8 (unit: mm)
FR-4 25.4 x 25.4 x 0.8 (unit: mm)
(a)
25.4
(b)
Note 3: a) The power dissipation and thermal resistance values are shown for a single device (During single-device operation, power is only applied to one device.). b) The power dissipation and thermal resistance values are shown for a single device (During dual operation, power is evenly applied to both devices.). Note 4: VDD = -16 V, Tch = 25C (initial), L = 0.5 mH, RG = 25 , IAR = -1.5 A Note 5: Repetitive rating: pulse width limited by maximum channel temperature Note 6: on the lower left of the marking indicates Pin 1.
2
2006-11-16
TPCF8302
Electrical Characteristics (Ta = 25C)
Characteristics Gate leakage current Drain cut-off current Drain-source breakdown voltage Gate threshold voltage Symbol IGSS IDSS V (BR) DSS V (BR) DSX Vth RDS (ON) Drain-source ON resistance RDS (ON) RDS (ON) Forward transfer admittance Input capacitance Reverse transfer capacitance Output capacitance Rise time Turn-on time Switching time Fall time Turn-off time Total gate charge (gate-source plus gate-drain) Gate-source charge1 Gate-drain ("miller") charge tf toff Qg Qgs1 Qgd |Yfs| Ciss Crss Coss tr VGS ton 0V -5 V 4.7 ID = -1.5 A VOUT RL = 6.7 VDS = -10 V, VGS = 0 V, f = 1 MHz Test Condition VGS = 10V, VDS = 0 V VDS = -20 V, VGS = 0 V ID = -10 mA, VGS = 0 V ID = -10 mA, VGS = 10 V VDS = -10 V, ID = -200 A VGS = -2.0 V, ID = -1.5 A VGS = -2.5 V, ID = -1.5 A VGS = -4.5 V, ID = -1.5 A VDS = -10 V, ID = -1.5 A Min -20 -10 -0.5 3.1 Typ. 100 68 44 6.2 800 120 160 6.2 15 17 51 11 1.1 3.3 Max 10 -10 -1.2 200 95 59 ns nC pF S m Unit A A V V
VDD -10 V - < 1%, tw = 10 s Duty = VDD -16 V, VGS = -5 V, - ID = -3 A
Source-Drain Ratings and Characteristics (Ta = 25C)
Characteristics Drain reverse current Forward voltage (diode) Pulse (Note 1) Symbol IDRP VDSF Test Condition IDR = -3.0 A, VGS = 0 V Min Typ. Max -12 1.2 Unit A V
3
2006-11-16
TPCF8302
ID - VDS
-5 -10 -4 -6 -2.5 -3.0 -2.0 -1.8 -10 -10 -2.5 -3.0 -8
ID - VDS
Common source Ta = 25C Pulse Test -2.0 -6 -1.8 -4 -1.6 -2 VGS = -1.4 VGS = -1.4 V 0 0
ID (A)
-3
Common source Ta = 25C Pulse Test
Drain current
-2
-1.6
-1
0 0
-0.2
-0.4
-0.6
-0.8
Drain current
ID
(A)
-6
-1.0
-1.0
-2.0
-3.0
-4.0
-5.0
Drain-source voltage
VDS
(V)
Drain-source voltage
VDS
(V)
ID - VGS
-5 Common source -4 -2.0
VDS - VGS
Common source
(V)
VDS = -10 V Pulse Test
Ta = 25 -1.6 Pulse Test
(A)
ID
-2 Ta = -55C -1 100 25 0 0
Drain-source voltage
-3
VDS
-1.2 -0.8
Drain current
-0.4
-0.75
-1.5 ID = -3A
-1
-2
-3
0 0
-2
-4
-6
-8
-10
Gate-source voltage
VGS
(V)
Gate-source voltage
VGS
(V)
Yfs - ID
100 1000 Common Source Ta = 25C Pulse Test
RDS (ON) - ID
Forward transfer admittance Yfs (S)
10
Ta = -55C
Drain-source ON resistance RDS (ON) (m)
VGS = -2.0V 100 -2.5 -4.5
100 25 1 Common Source VDS = -10 V 0.1 0.1 Pulse Test -1 -10
10 0.1
-1
-10
Drain current
ID (A)
Drain current ID (A)
4
2006-11-16
TPCF8302
RDS (ON) - Ta
160 Common Source Pulse Test ID = -3A -10 -10
IDR - VDS
-3.0 -5.0 -3
Drain reverse current IDR (A)
-5 -1.0 VGS = 0 V -1 -0.5 -0.3 Common Source Ta = 25C Pulse Test -0.1 0
Drain-source ON resistance RDS (ON) (m )
120
VGS = -2.0V
-1.5A,-0.75A
80
VGS = -2.5V ID = -3A,-1.5A,-0.75A
40 ID = -3A,-1.5A,-0.75A
VGS = -4.5V
0 -80
-40
0
40
80
120
160
0.2
0.4
0.6
0.8
1.0
1.2
Ambient temperature Ta (C)
Drain-source voltage
VDS
(V)
Capacitance - VDS
10000 -2.0
Vth - Ta
-1.6
(pF)
1000
Ciss
Gate threshold voltage Vth (V)
Capacitance C
-1.2
Coss 100 Common Source VGS = 0 V f = 1 MHz Ta = 25C 10 -0.1 -1 -3 -5 -10 -30 -50 -100 Crss
-0.8 Common Source -0.4 VDS = -10 V ID = -200A Pulse Test 0 -80 -40 0 40 80 120 160
Drain-source voltage
VDS
(V)
Ambient temperature Ta (C)
PD - Ta
2.0
Device mounted on a glass-epoxy board (a) (Note 2a) (1) Single-device operation (Note 3a)
Dynamic input / output characteristics
-20 -10
(V)
1.6
Device mounted on a glass-epoxy board (b) (Note 2b)
-16
Drain power dissipation PD (W)
(4) Single-device value at dual operation (Note 3b)
Drain-source voltage
(2) 0.8 (3) 0.4 (4) 0 0
-8 -8 -16
-8 Common source
-4
-4
-4
ID = -3 A Ta = 25C Pulse Test
-2
40
80
120
160
200
0 0
4
8
12
0 16
Ambient temperature Ta (C)
Total gate charge Qg (nC)
5
2006-11-16
Gate-source voltage
1.2
5S
VDS
(1)
(3) Single-device operation (Note 3a)
VDD = -16V -12 VDD=-4V
VGS
-8
-6
VGS (V)
(2) Single-device value at dual operation (Note 3b)
VDS
TPCF8302
rth - tw
1000 Single pulse (4) (3) (2)
Transient thermal impedance rth (C/W)
100
(1)
10
Device mounted on a glass-epoxy board (a) (Note 2a) (1) Single-device operation (Note 3a) (2) Single-device value at dual operation (Note 3b) Device mounted on a glass-epoxy board (b) (Note 2b) (3) Single-device operation (Note 3a) (4) Single-device value at dual operation (Note 3b)
1 0.001
0.01
0.1
1
10
100
1000
Pulse width
tw (s)
Safe Operating Area
100
(A)
ID max (pulse) * 10 1 ms * 100 s *
Drain current ID
1
Single pulse Ta=25 Curves must be derated linearly with increase in temperature.
0.1 0.1
VDSS max 10 100
1
Drain-source voltage
VDS (V)
6
2006-11-16
TPCF8302
RESTRICTIONS ON PRODUCT USE
* The information contained herein is subject to change without notice.
20070701-EN
* TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer's own risk. * The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. * Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.
7
2006-11-16


▲Up To Search▲   

 
Price & Availability of TPCF8302

All Rights Reserved © IC-ON-LINE 2003 - 2022  

[Add Bookmark] [Contact Us] [Link exchange] [Privacy policy]
Mirror Sites :  [www.datasheet.hk]   [www.maxim4u.com]  [www.ic-on-line.cn] [www.ic-on-line.com] [www.ic-on-line.net] [www.alldatasheet.com.cn] [www.gdcy.com]  [www.gdcy.net]


 . . . . .
  We use cookies to deliver the best possible web experience and assist with our advertising efforts. By continuing to use this site, you consent to the use of cookies. For more information on cookies, please take a look at our Privacy Policy. X